Industries
Built for precision manufacturing processes that require predicting outcomes and continuously adjusting production conditions.
Semiconductor Manufacturing
Connect metrology, prediction and control across repeating processes like CMP, CVD, Etch and Cleaning to reduce variation and optimize conditions.
Estimate removal and thickness,
then calculate the next wafer conditions
Estimate results for unmeasured wafers and calculate polishing time or recipe from the target and previous result. Zone-level conditions can also be adjusted to control profile.
View related use cases →Estimate film outcomes and compensate
the next run as the process drifts
Estimate unmeasured results from process and equipment data. Chamber and consumable changes, along with target values, can also feed into calculating the next run's conditions.
View related use cases →Use process signals to assess state
and feed the result into the next run
Estimate results from OES and other process signals plus equipment data, and reflect any gap from target in the next process conditions.
Operate recurring processes while
accounting for product and tool differences
Model results by combining upstream state and equipment data, and set operating criteria for each product and tool.
Power & Compound Semiconductors
Manage equipment and chamber state alongside product variation in highly sensitive processes like SiC and GaN.
Photonics & Optoelectronics
Fill metrology gaps and keep process conditions stable across thin-film deposition, etch and optical-property measurement.
MEMS & Sensors
Run models and control policies for high-mix sensor and MEMS processes, reflecting each product's conditions and equipment state.
Advanced Packaging
Connect metrology and process results across advanced packaging steps like bonding, CMP and plating to automate repeated corrections.
Display & Microdisplay
Manage spatial uniformity and process drift across thin-film, etch and deposition-based display manufacturing.
Solar &
Photovoltaics
Connect process state and quality in solar cell manufacturing that uses semiconductor-like processes such as HJT, tandem, thin-film and perovskite.
Model boat and position differences
to reduce within-batch variation
Model position-to-position differences within a batch and adjust zone or position conditions to reduce variation between products.
Explore Batch Control →Estimate unmeasured results and compensate conditions as chamber state changes
Estimate results for unmeasured substrates and adjust the next run or batch conditions to match chamber state and product conditions.
View related use cases →